Reading:

• Linear resistor measurement: 100 Ω to 100 MΩ with <10% error; 220Ω to 10 MΩ < 5% error @ 0.5 V;
  
• Linear resistor reading acquisition time: 20 ms;
• Minimum current measurement: ±1 nA (<5% error @ 0.5 V);
• Maximum current measurement: ±5 mA (<5% error @ 0.5 V);
• Non-linear resistor maximum reading acquisition time: 700us - 1 ms.

Writing:

• Maximum pulse amplitude: ±12 V;
• Voltage pulse resolution (0 - ±1 V): 3 mV;
• Voltage pulse resolution (±1 V - ±12 V): 24 mV;
• Current cut-off range: 10uA - 1000uA;
• Minimum pulse width: 90 ns;
• Pulse width resolution: 10 ns;
• Maximum sourcing/sinking current: 50 mA;
• Minimum READ -> WRITE interval: 120 us;
• Minimum WRITE->READ interval: 100 us;

Crossbar management:

• Supports up to 32x32 crossbars (1 kbit);
• Four 2x8 headers support external connection;
• Four BNC connectors expose the active/inactive word and bit lines;
• A 86 pin PLCC slot allows packaged samples to be mounted and tested on-board;
• Active multi-port current redistribution scheme;
• V/2 and V/3 write scheme;

User Interface:

• Python based - open source;
• Read Single, Read All or Read Stand Alone capabilities;
• Ability to select in between two read types;
• Color coded resistance map of DUT crossbar, updates after any operation;
• Click-to-pulse: apply single voltage pulse followed by a read operation;
• Real-time view of resistance evolution, along with the history of the pulsing operations performed;
• Pan, zoom and save publication-quality figures of the DUT history straight from the interface;
• Record the history of applied pulsing modules/single reads/single pulses in a separate history log;
• Expandable: new pulsing modules are added as separate unique files;

Master u-Controller: mBED LPC 1768:

• 96 MHz Cortex M3 processor
• on board DAC: 10 bit
• on board ADC: 12 bit

ArC ONE comes with the following standard built-in modules: (can be applied automatically on 32x32 crossbar array, array subsets or individual devices)

• Electroforming: Incremental step pulsed programming routine; stop when benchmark resistance level reached: Multistate programming;

• Curve Tracer: I-V sweeping over the full voltage range with optional current cut-off between 10u and 1mA: Multicycle IV with current cut-off, Multicycle IV;

• Endurance: Cycle switch a device ON and OFF for up to 10^12 cycles, with optional current cut-off between 10u and 1mA: Endurance with current cut-off,  Endurance example;

• Retention: Measure periodically for fixed overall duration:

• SwitchSeeker: Assuming a bipolar device, apply voltage pulses of increasing width and amplitude of both polarities in order to extract the pulse parameters which elicits repeatable analogue RS. Repeatable analogue RS;

• STDP: Perform Spike-Timing Dependent Plasticity measurements with your choice of pre- and post-synaptic voltage spike shapes and durations. STDP;

• Volatility Testing: Quantify the short-term volatile behavior of presumably long-term non-volatile devices. Volatile RS;

• SuperMode: Allows drag-and-drop buildup of chain of measurement procedures from the ones above, including single READ operations, single voltage pulses and time delays.