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ArC TWO is a generic microchip characterisation platform, including emerging memory crossbar arrays but also other types of components such as data converters. It features 128× channels, of which 64× are independent source-meter units with full analogue capabilities up to ±20 V, enable work with NT1R crossbar arrays, digital microchips with up to 128 pads and analogue or mixed-signal chips with up to 64 analogue pads. An ArC TWO board includes: a) a straightforward and extendable user interface for quick starting; b) a detachable daughter-board slot allowing for custom PCBs to piggy-back on ArC's infrastructure and c) an open-source API for advanced users.
ArC TWO Control Panel: 0.1.0, or github
ArC TWO Python Bindings: or github
User Manual with UI introduction: [HTML]
ArC TWO is a fully parallel instrument: this means it is designed to allow concurrent and independent control of its 128× terminals. This enables significant capabilities such as the handling of NT1R crossbar arrays for emerging memory (32× analogue wordlines + 32× analogue bitlines + 32× digital control lines for example) or the characterisation of generic ICs such a data converter chip. The interface is straightforward and extendable, designed to allow non-specialist users to enjoy basic functionality with minimal training and the entire instrument fits on a desktop and can even be easily transported for cross-laboratory experiments.
The current version of ArC TWO inherits all of the functionality present in ArC ONE, allowing I-V measurement, voltage biasing under current compliance and an array of automated tests. However, it also adds significant new functionality such as biasing via fine-grained series resistances (0-1kOhm in 1000 steps), high-speed pulse capability (down to 40 ns) and -of course- fully parallel biasing of complex circuits or arrays.
Similar to ArC ONE, executing a variety of microchip tests becomes trivial via the implementation of automated testing. Moreover, tests can be executed with results displayed in real-time. Finally, we offer a service for developing any testing module that suits your needs, but also developing daughter-boards to host your selection of test chips and/or connectors to other systems such as potentially probe cards. Email us if you have specific needs regarding modules, daughter-boards or probe-cards for more a more detailed discussion.
Technical paper about ArC TWO: P. Foster, J. Huang, et al, "An FPGA-based system for generalised electron devices testing", Sci. Rep., 12, 13912, 2022
Reading Operations
Current Readings:
Voltage Readings:
Programming Operations
Operation Intervals
Programmable I/O
Crossbar management
Expansion capability
Software components